X-ray Diffraction

AutoMATE II

Residual stress may be created during the manufacturing process of a material, or it may accumulate in a structure over many years in operation. In either case, this stress can have a serious negative effect on a product’s quality, durability and lifetime. Accurate detection of residual stress is an important element of the quality control […]

RAPID II

D/MAX RAPID II is arguably the most versatile micro-diffraction XRD system in the history of materials analysis. In production for well over a decade and continuously improved during that time period, the success of the D/MAX RAPID II is a testament to the suitability of imaging plate technology for measuring diffraction patterns and diffuse scattering […]

TTRAX III

The TTRAX III is the world’s most powerful diffractometer. Utilizing an 18 kW rotating anode X-ray source in a θ/θ geometry provides the perfect system for demanding applications. Both thin film diffraction and the determination of trace phases in powdered samples benefit greatly from the TTRAX’s high powered source. Engineered for Versatility The TTRAX incorporates […]

SmartLab SE

The SmartLab SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross beam optics and advanced photon counting hybrid pixel array detectors (HPAD). Guidance […]

SmartLab®

The SmartLab is the most novel high-resolution X-ray diffractometer available today. Perhaps its most novel feature is the SmartLab Guidance software, which provides the user with an intelligent interface that guides you through the intricacies of each experiment. It is like having an expert standing by your side. XRD engineered for performance The system incorporates […]

Ultima IV

The Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku’s patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray diffractometer can perform many different measurements…fast. Engineered for Performance With a multipurpose diffractometer, performance is measured by not only how […]

MiniFlex

New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality […]