Project Description
The SmartLab is the most novel high-resolution X-ray diffractometer available today. Perhaps its most novel feature is the SmartLab Guidance software, which provides the user with an intelligent interface that guides you through the intricacies of each experiment. It is like having an expert standing by your side.
XRD engineered for performance
The system incorporates a high resolution θ/θ closed loop goniometer drive system, cross beam optics (CBO), an in-plane scattering arm, and an optional 9.0 kW rotating anode generator.
XRD designed for flexibility
Coupling a computer controlled alignment system with a fully automated optical system and the Guidance software makes it easy to switch between hardware modes, ensuring that your hardware complexity is never holding back your research.
XRD that is functionality redefined
Whether you are working with thin films, nanomaterials, powders, or liquids the SmartLab will give you the XRD functionality to make the measurements you want to make when you want to make them.
Features
- Full automated alignment under computer control.
- Optional in-plane diffraction arm for in-plane measurements without reconfiguration.
- Focusing and parallel beam geometries without reconfiguration.
- SAXS capabilities.
Accesories
| Pix-3000 Hybrid Pixel Array Detector | 2D semiconductor detector with large active area (approx. 3000 mm²), small pixel size (100 μm²), ultra-high dynamic range, high sensitivity, and XRF suppression by high and low energy discrimination. Seamless switching from 2D-TDI (Time Delay and Integration) mode to 2D snapshot mode to 1D-TDI mode to 0D mode with a single detector. |  |
| D/teX Ultra 250 | The D/tex Ultra 250 is a 1D silicon strip detector that decreases data acquisition time by almost 50% compared to competitive detectors. This is achieved by increasing the active area of the aperture and thus increasing the count rate. Compared to the previous model, the D/teX Ultra, has a smaller pixel pitch (0.075mm) and is longer in the direction of 2θ. For researchers who are interested in the lowest XRF suppression possible, the combination of an optional receiving monochromator and low-enrgy discrimination offer outstanding suppression.
The D/teX Ultra 250 is designed for the SmartLab diffractometer, Rigaku’s most innovative diffraction product. |
 |
| D/teX Ultra 250 HE | The D/teX Ultra 250 HE is a special silicon strip detector that is optimized for high energy X-ray work by utilizing a thicker detector material. For Cr, Fe, Co, and Cu, the efficiency is approximately 99%. With Mo radiation the efficiency is approximately 70%. |  |
| Mapping Stage | Allows xy positioning of the sample in the X-ray beam. 20 mm, 50 mm, and 75 mm translations available. |  |
| RxRy Tilt Stage | Allows xy positioning of the sample in the X-ray beam. 20 mm, 50 mm, and 75 mm translations available. |  |
| Secondary Monochromator | The optional secondary monochromator can be used with the D/teX Ultra 250 silicon strip detector for outstanding energy resolution. If the D/teX Ultra 250 is used in conjunction with the secondary monochromator an energy resolution of 320 eV is achieved, or 4% with CuKα. |  |
| Anton Paar DCS 350 Domed Cooling Stage | Sample cooling and heating stage with spherical X-ray window for in-situ texture and thin film analysis. Compact and light-weight stage with liquid nitrogen sample cooling. Temperature range: -100 °C to 350 °C Atmospheres: air, inert gas, vacuum(10⁻¹ mbar) |
 |
| Anton Paar DHS 1100 Domed Hot Stage | Sample heating stage with spherical X-ray window for in-situ texture and thin film analysis. Compact and light-weight stage with air-cooling. Temperature range: 25 °C to 1100°C Atmospheres: air, inert gas, vacuum(10⁻¹ mbar) |
 |
| Anton Paar HTK 1200N High-Temperature Oven Chamber | High-temperature heating stage for powders and polycrystalline solid samples. Heating to 1200 °C in air and vacuum possible.
Main features:
Temperature range: 25 °C to 1200 °C |
 |
| Anton Paar HTK 16N High-Temperature Chamber | High-temperature sample heating stage with strip heater for powder diffraction. Allows for very fast heating and cooling and ensures high sample position stability with heating strip pre-stressing.
Temperature range:
Atmospheres: air, inert gas, vacuum(10⁻⁴ mbar) |
 |
| Anton Paar HTK 2000N High-Temperature Chamber | High-temperature sample heating stage with strip heater for powder XRD of refractory materials. The use of a tungsten strip offers extremely high temperature and fast heating and cooling, the strip pre-stressing mechanism ensures high sample position stability.
Temperature range:
Atmospheres: vacuum(10⁻⁴ mbar), inert gas, air |
 |
| Anton Paar TTK 450 Low Temperature Chamber | Sample cooling and heating stage with liquid nitrogen cooling. Large temperature range and ease of use for a wide range of applications. With beam knife and optional zero background sample holder for investigation of organic materials at low 2θ angles.
Temperature range: -193 °C to 450 °C |
 |
